SEWICKLEY, PA (June 14, 2004) — Printing Industries of America and the Graphic Arts Technical Foundation (PIA/GATF) has announced the appointment of Dr. Mark Bohan as Director of Integrated Technology, effective August 2, 2004. Joining PIA/GATF’s expert research team, Bohan will lend a new level of expertise as head of the JDF certification program and will also serve as principal scientist on several projects. Bohan joins PIA/GATF from the School of Engineering at the University of Wales Swansea where he served as lecturer and research manager of the Welsh Centre for Printing and Coating. He has been active in an extensive range of printing, paper and coating research with particular focus on transfer mechanisms. His research efforts include projects in lithography, flexography, rotogravure and numerous coating processes. His main areas of expertise include ink-paper interaction, substrate characterization, experimental methods, instrumentation, process optimization and numerical modeling. Dr. Bohan has been published extensively throughout the world. He was also actively involved with the development of graphic arts ISO standards. “The consolidation of PIA and GATF has allowed us to reinvest in the research staff at GATF much sooner than we expected with the fortunate addition of Dr. Bohan,” says PIA/GATF President and CEO Michael Makin. “We are very excited about the breadth and depth of expertise that Mark brings to our research department.” Added George Ryan, PIA/GATF’s Executive Vice President and Chief Operating Officer. “He will spearhead the JDF certification program at PIA/GATF and will serve as principal scientist for several projects at the Foundation.”