Microtek and NetChip to Demo USB 2.0 High-Speed Scanner
Thursday, March 01, 2001
Feb., 23, 2001- NetChip Technology, a leader in USB 2.0 technology, and Microtek, a premier scanner manufacturer, are teaming up to demonstrate the world's first USB 2.0 high-speed scanner at Intel Developer Forum (IDF) at the San Jose Convention Center from February 26 to March 1, 2001 at booth number #804 and the USB Pavilion. The Microtek scanner will include the latest USB 2.0 high-speed device controller from NetChip. "A year ago, NetChip also teamed with Microtek to demonstrate a USB 2.0 scanner prototype using test silicon during the IDF keynote address from Pat Gelsinger, Intel's Vice President and Chief Technology Officer, Intel Architecture Group." says Robert Wong, NetChip's vice president of sales and marketing. "This time, we are ready to show off our production ready silicon and scanner." "Microtek was an early adopter of USB 1.1 technology," says Meng-Ta Tsai, Microtek's Vice President of Research and Development. " Working with NetChip and their world's leading USB 2.0 chips, we can continue to maintain our leadership in advanced technology and digital imaging products."